Semiconductor material and device characterization
Contact resistance and Schottky barriers, optical characterization. Interface traps and inversion charge frequency response to the extraction of the effective mobility. X-Ray and Gamma-Ray techniques, schematic of a scanning electron microscope.
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Sublimated bulk at temperatures and the effect of sublimation temperature on the morphology of product. Fourier transform infrared spectroscopy. X-ray Diffraction Patterns. Scanning Electron Microscopy Images. Preparation of [Zn(acac)2] Nanostructures.
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статья, добавлен 24.02.2016- 14. Quantum optics
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автореферат, добавлен 05.11.2018